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X - Rays are electromagnetic radiation by fairly elevated penetration power or energy. For example, voids in solder, cracks and phase changes in minerals/rocks, and electronic circuits encased in plastic can all benefit from the transmission X-ray imaging capabilities of micro-XRF systems such as the XGT instruments.X вЂ“ Ray Diffraction Method, Chemistry tutorial It is thus possible to generate detailed images of a sample's physical structure which would ordinarily be invisible to the eye. The result is similar to typical X-ray radiographs taken in hospitals, but benefiting from the ultra-high spatial resolution that the micro-XRF systems afford. Since many samples are partially transparent to X-rays, a small scintillation detector directly beneath the sample (and aligned with the X-ray optic) can be used to measure the intensity of X-rays which pass through the sample.ДЄs the sample is scanned to generate element images, an image of transmitted X-ray intensity is simultaneously created. Since the X-ray micro-beams generated through the mono-capillary optics exhibit near perfect collimation, they retain their narrow diameters and intensity even at large distances from the mono-capillary tip. Micro-XRF systems which use mono-capillary optics can provide additional imaging functionality - transmitted X-ray imaging.

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In this manner, time consuming repeat measurements are done automatically, leaving the instrument operator free for other activities. In this manner, different visual features across the sample can be automatically analyzed with ease, or indeed, multiple samples laid out on the sample stage can be analyzed in turn. Once these have all been selected and the measurement conditions chosen, the motorized stage will move to each position in turn, acquiring a spectrum at each before moving to the next.

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In addition to manually aligning the sample so that a specific feature can be discretely analyzed, it is also possible to store in the software a list of positions for analysis. Typical instrument software will enable fast sample positioning by seamlessly linking camera images with sample movement. Color video cameras allows the sample to be visualized by the operator. Light elements (ie, low energy fluorescent X-rays) will be detectable only at the surface of a sample matrix comprised of heavy elements (ie, strong absorption).ДЄ typical micro-XRF instrument such as the XGT systems includes a high precision motorized sample stage, which allows the sample to be very accurately positioned beneath the X-ray beam. To summarize, heavy elements (ie, energetic fluorescent X-rays) will be detectable relatively deep within a sample matrix primarily comprised of light elements (ie, low absorption). The higher the concentration of heavier elements which absorb strongly, the more reduced the chance of X-rays escaping from deep within the sample. Heavier elements (eg, Cu, Ag, Au) have much more energetic X-rays which will be able to pass through large distances within the sample.Д¬learly the sample composition itself is also an important factor. The lighter elements (eg, Na, Mg, Al, Si) have very low energy X-rays, and thus will be difficult to detect even at relatively small depths within the sample. The ability of fluorescent X-rays to penetrate through and escape from the sample itself depends again on their energy, which directly relates to which elements are being detected. The continuum spectrum is most intense towards the higher energy cut off - by reducing the voltage it is possible to reduce this 'average energy' of the continuum, and thus reduce penetration. As their name suggests, these X-rays have a continuous energy range (up to a maximum equal to the accelerating voltage of the generator. Secondly, the bremsstrahlung (or continuum) X-rays must be considered.

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If however, the voltage is reduced to such an extent that the higher energy X-rays are no longer excited, then the characteristic X-rays will be low energy L lines only - as a result the expected penetration will be greatly reduced. Usually the K lines will be more intense, and so these will dominate in considerations about penetration.

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If the generator voltage is sufficient to excite multiple lines (eg, K and L) then both high energy (K) and low energy (L) X-rays will be incident on the sample.

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The primary X-rays should be considered in two parts, both of which are effected by the voltage setting of the X-ray generator.ДЇirst of all, the characteristic X-rays from the anode target material are at a fixed energy.

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